Multifunctional new apple-logic function test card

Abstract

 In this paper a simple and efficient new tester based on Apple-Ⅱeis proposed for logic function test. This tester is capable of drawing logic link pictures, measuring logic function of each module with independent function on the same IC of series of 74/54 digital ICs. It can also be used to search for the type number of unidentified ICs with normal function. The working principle of the system is based on the stored-response method, namely, input data to the IC under test are provided first, the response of which is then compared with the correct response stored in the memory. Test data set for an IC is presented in the paper. And the methods discussed are applicable to the reextension of the tester's functions.